Ever wondered how imaging and characterisation tools work to provide insights on device failure?
Participants of this introductory course will be equipped with fundamental knowledge on microscopy and thin film characterisation for failure analysis. There will also be hands-on opportunities and demonstrations during lesson to facilitate learning.
Upon completion, participants will be better able to understand the working principles and applications of microscopes and thin film characterisation tools for failure analysis.
By the end of the course, participants will be able to
explain how microscopy and thin film characterisation are commonly used in
the semiconductor, manufacturing, and coating industries
understand the working principles and differences of various microscopes and thin film
characterisation tools for an effective failure analysis
demonstrate an understanding for a) various types of microscopes (such as optical and electron microscopes) and recognise the relationship among magnification, resolution, and depth of field for an effective imaging; b) various thin film characterisation tools (such as ellipsometer and four-point probe) to obtain important properties of thin film or coating
Who Should Attend?
Engineering or technical personnel who are interested to learn about microscopy and thin film characterisation tools for failure analysis.
Participants are expected to be familiar with the general operation of a personal computer (PC) or Macintosh (MAC), such as browsing the internet, opening, and saving files, etc.
Participants will be awarded the Certificate of Attendance by Republic Polytechnic upon meeting 80% of the attendance requirement.
Mr. Lau Gih Sheng joined Republic Polytechnic (RP) in 2008 and is currently a senior lecturer in the School of Engineering under the Diploma in Electrical and Electronics Engineering. As an educator, he developed a module on measurement techniques and failure analysis for both full-time and part-time students.
Prior to joining RP, Mr. Lau was a Materials Science and Characterisation Laboratory Research Fellow in the Institute of Materials Research & Engineering at A*STAR. Between 2002 to 2005, he worked on multiple materials characterisations as well as research and development projects involving thin film coatings.
Mr. Lau is also experienced in Failure Analysis (FA). He was employed by Chartered Semiconductor Manufacturing Limited where he worked as a Senior Process Integration Engineer for two years and spent significant time in the FA department performing failure analysis.
Thank you for your interest. This course is currently fully subscribed. You can submit your interest by clicking on the “Register Interest” button, and we will contact you when the next course run is available.
1 day (8 hours, with breaks)
RP ACE @ Woodlands
Full Course Fee (Others)
Singapore Citizens aged 40 & above
SME-sponsored Singapore Citizens OR Singapore PR
Singapore Citizens aged 39 & below OR Singapore PR
• Payment may be made using SkillsFuture Credit.
• Fees reflected are inclusive of GST (Goods and Services Tax).
• From 1 July 2020, Workfare Training Scheme (WTS) and fee subsidy under WTS will cease. WTS will be replaced by Workfare Skills Support Scheme (WSS). For more information on WSS, please refer to https://www.wsg.gov.sg/programmes-and-initiatives/workfare-skills-support-scheme-individuals.html.
Republic Polytechnic reserves the right to make changes to the course fee and application closing dates without prior notice. The commencement of each course is subject to sufficient number of participants.
All information is accurate at time of publishing.